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Single-Event Effect Test Report Texas Instruments DS25BR100 LVDS BufferThis study was to determine the destructive single-event effect (SEE) susceptibility of the DS25BR100 series Low-Voltage Differential Signaling (LVDS) Buffers with Pre-emphasis and Equalization (DS25BR100, 110, and 120). The device was monitored primarily for destructive events while exposing it to a heavy ion beam at the Texas A&M University’s (TAMU) K500 Cyclotron.
Document ID
20210015659
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Memorandum (TM)
Authors
Ted Wilcox (Goddard Space Flight Center Greenbelt, Maryland, United States)
Michael Campola (Goddard Space Flight Center Greenbelt, Maryland, United States)
Matt Joplin (Goddard Space Flight Center Greenbelt, Maryland, United States)
Date Acquired
May 14, 2021
Publication Date
June 1, 2021
Publication Information
URL: https://radhome.gsfc.nasa.gov/
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA/TM-20210015659
Funding Number(s)
PROJECT: Roman Space Telescope (RST)
WBS: 134180.02.02.02
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert

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