A method and apparatus for rapidly testing arrays of cells, such as memory devices, in which a limited number of redundant rows and columns are available for repair. Repairs are to be made by substituting redundant rows and columns for original rows and columns of the array that contain faulty cells....http://www.google.com.hk/patents/US4586178?utm_source=gb-gplus-share專利 US4586178 - High speed redundancy processor
