A scan technique using linear matrix to drive scan chains is used, along with an ATPG, to constraint scan test vectors to be generated through the linear matrix. The linear matrix scan technique reduces the test application time and the amount of test vector data by several orders of magnitude over conventional...http://www.google.com.hk/patents/US7925941?utm_source=gb-gplus-share專利 US7925941 - Test compaction using linear-matrix driven scan chains
