A new circuit architecture is provided for testing digital integrated circuits which allows one to arbitrarily force any combination of logic values to be simultaneously driven onto any combination of internal nets. This allows all of the connections to each internal logic cell, and the logic cell itself,...http://www.google.com.hk/patents/US6150807?utm_source=gb-gplus-share專利 US6150807 - Integrated circuit architecture having an array of test cells providing full controllability for automatic circuit verification
