A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously...http://www.google.com.hk/patents/US7774663?utm_source=gb-gplus-share專利 US7774663 - Dynamically reconfigurable shared scan-in test architecture
