The inputs to an embedded core, e.g., the core terminals, may not be directly connected to pins on the SoC. The lack of direct access to an embedded core's terminals may complicate testing of the embedded core. A test wrapper including boundary scan test (BST) cells may be used to test an embedded core....http://www.google.com.hk/patents/US7568141?utm_source=gb-gplus-share專利 US7568141 - Method and apparatus for testing embedded cores
