A memory tester including an algorithmic pattern generator (ALPG) for generating a test pattern as a digital signal based on vector data is provided with a digital-to-analog converter built in the memory tester or provided outside the memory tester. Thus, the function of a device under test (DUT) having...http://www.google.com.hk/patents/US6492923?utm_source=gb-gplus-share專利 US6492923 - Test system and testing method using memory tester
