A probe card 2 for an IC testing apparatus electrically connected to a test head board 11 of the IC testing apparatus and having a plurality of needle contacts 211 provided on a main surface for electrical contact with a device under test, wherein a plurality of zero insertion force connectors electrically...http://www.google.com.hk/patents/US6292005?utm_source=gb-gplus-share專利 US6292005 - Probe card for IC testing apparatus
