A three-dimensional shape measuring method by which measurement of a three-dimensional shape is realized with an improved precision. Grid patterns comprising a plurality of one-dimensional grids 1, 2 and 3, each having a period and direction different from those of the others, are simultaneously projected...http://www.google.com.hk/patents/US6750975?utm_source=gb-gplus-share專利 US6750975 - Three-dimensional shape measuring method
