A plurality of probe wires are held by a probe supporter having a substantially rectangular cross-section. First, second and third side walls of the supporter, support the probe wires in a manner wherein they are arranged at predetermined intervals in an essentially parallel relationship with each other....http://www.google.com.hk/patents/US5084672?utm_source=gb-gplus-share專利 US5084672 - Multi-point probe assembly for testing electronic device
